DRAM
The architecture, materials choice and process technology for stacked-capacitors
in
embedded-DRAM applications are a crucial concern for each new technology node. Capacitor
technology is transitioning from the early days of planar PIS (poly/insulator/silicon)
capacitors to the MIM (metal/insulator/metal) capacitors used for todays 65 nm technology node. ALD
Ta2O5, HfO2 and especially Al2O3 are
working well
as
high-k dielectric and ALD TiN as metal electrodes for use in 65 nm
eDRAM technology.
The use of ALD is
identified
to be an enabling technology for
both
high-k dielectrics and
capacitor electrodes.