DRAM

The architecture, materials choice and process technology for stacked-capacitors in embedded-DRAM applications are a crucial concern for each new technology node. Capacitor technology is transitioning from the early days of planar PIS (poly/insulator/silicon) capacitors to the MIM (metal/insulator/metal) capacitors used for todays 65 nm technology node. ALD Ta2O5, HfO2 and especially Al2O3 are working well as high-k dielectric and ALD TiN as metal electrodes for use in 65 nm eDRAM technology. The use of ALD is identified to be an enabling technology for both high-k dielectrics and capacitor electrodes.